Kalibrační vzorky pro SEM (SEM calibration specimens)
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EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, unmounted
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on std pin stub 12,7mm dia
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on Zeiss pin stub 12,7mm dia
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on 12,2mm JEOL stub
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on 15mm Hitachi stub
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on custom stub
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, unmounted
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, mounted on 12,7mm std pin stub
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, mounted on 12,7mm Zeiss pin stub
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, mounted on 12,2mm JEOL stub
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, mounted on 15mm Hitachi stub
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, mounted on custom stub
EM-Tec MCS-0.1CF certified calibration standard 2,5mm to 100nm, unmounted
EM-Tec MCS-0.1CF certified calibration standard 2,5mm to 100nm, mounted on std 12,7mm pin stub
EM-Tec MCS-0.1CF certified calibration standard 2,5mm to 100nm, mounted on Zeiss 12,7mm pin stub
EM-Tec MCS-0.1CF certified calibration standard 2,5mm to 100nm, mounted on 12,2mm JEOL stub
EM-Tec MCS-0.1CF certified calibration standard 2,5mm to 100nm, mounted on 15mm Hitachi stub
EM-Tec MCS-0.1CF certified calibration standard 2,5mm to 100nm, mounted on custom stub
EM-Tec M-1 calibration standard with 1um grid pattern, unmounted
EM-Tec M-1 calibration standard with 1um grid pattern, mounted on std. 12,7mm pin stub
EM-Tec M-1 calibration standard with 1um grid pattern, mounted on Zeiss 12,7mm pin stub
EM-Tec M-1 calibration standard with 1um grid pattern, mounted on 12,2mm JEOL stub
EM-Tec M-1 calibration standard with 1um grid pattern, mounted on 15mm Hitachi stub
EM-Tec M-1 calibration standard with 1um grid pattern, mounted on customer stub
EM-Tec M-10 calibration standard with 10um grid pattern, unmounted
EM-Tec M-10 calibration standard with 10um grid pattern, mounted on std. 12,7mm pin stub
EM-Tec M-10 calibration standard with 10um grid pattern, mounted on Zeiss 12,7mm pin stub
EM-Tec M-10 calibration standard with 10um grid pattern, mounted on 12,2mm JEOL stub
EM-Tec M-10 calibration standard with 10um grid pattern, mounted on 15mm Hitachi stub
S1933F Planotec silicon test specimen 5x5mm, on 12,5mm pin-stub G301F (6mm pin length)
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