Pro test rozlišení (Resolution test specimens)
Nejprodávanějí v kategorii
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S1988A Low kV Sn-C test specimen on 10mm JEOL stub
12 236 CZK
bez DPH 10 112 CZK
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ø12.7mm Zeiss pin stub
5 295 CZK
bez DPH 4 376 CZK
S1988B Low kV Sn-C test specimen on 15mm Topcon/ISI/ABT stub
12 236 CZK
bez DPH 10 112 CZK
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ø12.2mm JEOL stub
5 295 CZK
bez DPH 4 376 CZK
S1988C Low kV Sn-C test specimen on 15mm HITACHI stub
12 236 CZK
bez DPH 10 112 CZK
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ø15mm Hitachi stub
5 295 CZK
bez DPH 4 376 CZK
S1988D Low kV Sn-C test specimen on 12,5mm pin-stub, l=6mm
12 236 CZK
bez DPH 10 112 CZK
EM-Tec RXS-2WSi resolution and contrast test standard, fused W/Si on pin stub
11 229 CZK
bez DPH 9 280 CZK
S1988T Low kV Sn-C test specimen on thin (0,5mm) carbon disc ᴓ 6mm
12 236 CZK
bez DPH 10 112 CZK
S1988U Low kV Sn-C test specimen on carbon disc t=2mm, d=6mm
12 236 CZK
bez DPH 10 112 CZK
EM-Tec B100 Faraday cup for beam current measurements
3 485 CZK
bez DPH 2 880 CZK
S1937 Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ 12,5mm pin-stub, l = 8mm
14 780 CZK
bez DPH 12 215 CZK
S1937E Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ 12,5mm JEOL stub
14 780 CZK
bez DPH 12 215 CZK
S1937A Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ 10mm JEOL stub
14 780 CZK
bez DPH 12 215 CZK
S1937B Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ15mm Topcon/ISI/ABT stub
13 537 CZK
bez DPH 11 188 CZK
S1937C Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ15mm HITACHI stub
14 769 CZK
bez DPH 12 206 CZK
S1937SP Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ12,5mm pin-stub, l = 6mm
14 211 CZK
bez DPH 11 745 CZK
S1937T Universal test specimen Sn particles 5 nm - 30µm on C, thin (0,5mm) carbon disc ᴓ 6mm
14 780 CZK
bez DPH 12 215 CZK
S1937U Universal test specimen Sn particles 5 nm - 30µm on C, thick (2mm) carbon disc ᴓ 6mm
13 288 CZK
bez DPH 10 982 CZK
AGS168ZVTSI Gold on 230-330µm silicon substrate. Particles 30-300nm
6 109 CZK
bez DPH 5 049 CZK
AGS168VTSI Gold on 230-330µm silicon substrate. Particles 5-150nm
5 748 CZK
bez DPH 4 750 CZK
S168SI Resolution Au-Si test specimen, silicon substrate 500um
8 410 CZK
bez DPH 6 950 CZK
EM-Tec GSR-C1 Combi GSR test sample with QM test matrix and reference samples for EDS resolution, EDS calibration and BSD response, incl Faraday cup on an Aluminium Ø12.7 mm higher purity pin stub
46 464 CZK
bez DPH 38 400 CZK
Momentálně není dostupné
S1969T High resolution Au-C test specimen on thin carbon disc ᴓ 6mm, t=0,5mm
10 503 CZK
bez DPH 8 680 CZK
AGS1969VTSI Gold on 230-330µm silicon substrate. Particles 3-50nm
7 460 CZK
bez DPH 6 165 CZK
AGS1937 Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ 12,5mm pin-stub, l = 8mm
8 869 CZK
bez DPH 7 330 CZK
AGS1969SI Gold on 500µm silicon substrate. Particles 3-50nm
7 388 CZK
bez DPH 6 106 CZK
AGS1987VTSI Gold on 230-330µm silicon substrate. Particles 2-30nm
14 786 CZK
bez DPH 12 220 CZK
S1987SI Gold on 500µm silicon substrate. Particles 2-30nm
23 656 CZK
bez DPH 19 550 CZK
EM-Tec Sn on C resolution standard 6, 5nm-30um, mounted on Ø12.2mm JEOL stub
7 550 CZK
bez DPH 6 240 CZK
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