Kalibrační vzorky pro SEM (SEM calibration specimens)
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S168B Resolution Au-C test specimen on 15 mm Topcon/ISI/ABT stub
S168A Resolution Au-C test specimen on 10 mm JEOL stub
S168C Resolution Au-C test specimen on 15 mm HITACHI stub
S168D Resolution Au-C test specimen on 12,5 mm pin- stub, trn 6mm
S168E Resolution Au-C test specimen on 12,5 mm JEO stub
S168T Resolution Au-C test specimen on thin (0,5mm) carbon disc
S168U Resolution Au-C test specimen unmounted
S1969 High resolution Au-C test specimen on 12,5mm pin-stub, trn l=8mm
S1969A High resolution Au-C test specimen on 10mm JEOL stub
S1969B High resolution Au-C test specimen on 15mm Topcon/ISI/ABT stub
S1969C High resolution Au-C test specimen on 15mm HITACHI stub
S1969E High resolution Au-C test specimen on ᴓ12,5mm JEOL stub
S1969U High resolution Au-C test specimen on carbon disc ᴓ6mm, t=2mm
AGS1987 Ultra high resolution Au-C test specimen on 12,5mm pin-stub, trn l=8mm
AGS1987A Ultra high resolution Au-C test specimen on ᴓ10 mm JEOL stub
AGS1987B Ultra high resolution Au-C test specimen on 15mm Topcon/ISI/ABT stub
AGS1987C Ultra high resolution Au-C test specimen on ᴓ15 mm HITACHI stub
S1987D Ultra high resolution Au-C test specimen on Zeiss pin stub
AGS1987E Ultra high resolution Au-C test specimen on ᴓ12,5 mm JEOL stub
AGS1987T Ultra high resolution Au-C test specimen on thin (ᴓ6 x t=0,5mm) carbon disc
AGS1987U Ultra high resolution Au-C test specimen on carbon disc ᴓ6mmxt=2mm, unmounted
S1968 Prickly-gold test specimen on 12,5mm pin-stub
S1968E Prickly-gold test specimen on 12,5mm JEOL stub
S1968A Prickly-gold test specimen on 10 mm JEOL stub
S1968B Prickly-gold test specimen on 15 mm Topcon/ISI/ABT stub
S1968C Prickly-gold test specimen on 15 mm HITACHI stub
S1968D Prickly-gold test specimen on 12,5 mm pin-stub, l=6mm
S1968U Prickly-gold test specimen, unmouted
S168Z Low kV Au-C test specimen on 12,5mm pin-stub, l=8mm
S168EZ Low kV Au-C test specimen on 12,5mm JEOL stub
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