Kalibrační standardy a vzorky (Calibration standards and specimens)
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AGS168ZVTSI Gold on 230-330µm silicon substrate. Particles 30-300nm
S168ZSI Low kV Au-Si test specimen on 500 um silicon substrate
AGS168VTSI Gold on 230-330µm silicon substrate. Particles 5-150nm
S168SI Resolution Au-Si test specimen, silicon substrate 500um
S1969T High resolution Au-C test specimen on thin carbon disc ᴓ 6mm, t=0,5mm
AGS1969VTSI Gold on 230-330µm silicon substrate. Particles 3-50nm
AGS1937 Universal test specimen Sn particles 5 nm - 30µm on C, ᴓ 12,5mm pin-stub, l = 8mm
AGS1969SI Gold on 500µm silicon substrate. Particles 3-50nm
AGS1987VTSI Gold on 230-330µm silicon substrate. Particles 2-30nm
S1987SI Gold on 500µm silicon substrate. Particles 2-30nm
MAG*I*CAL traceable TEM magnification calibration standard, 1.000 to 1.000.000 x, on Ti TEM disc incl. Manual
S2005 PLANOTEC Si test specimen, 5um grid (x/y), unmounted
S100 Perforated carbon film, 3,05mm dia.
S2006 PLANOTEC Si test specimen, 5um grid (x/y), mounted on G301 pin stub
S124 Catalase crystals, grid 3,05mm dia.
S2006F PLANOTEC Si test specimen, 5um grid (x/y), mounted on G301F pin stub (pin l=6mm)
S136 Plane spacing 1.0nm, Copper phthalocyanine, grid 3,05mm dia.
S2007 PLANOTEC Si test specimen, 5um grid (x/y), mounted on Hitachi stub (15mm x 6mm)
S2008 PLANOTEC Si test specimen, 5um grid (x/y), mounted on JEOL stub (10mm x 10mm)
S122 Crocidolite crystals, grid 3,05mm dia.
S118 Potassium chloroplatinate crystals, grid 3,05mm dia.
S140 Graphitised carbon black, grid 3,05mm dia.
S135 Oriented gold crystal, grid 3,05mm dia.
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, unmounted
S132 Gold partictes on carbon film, grid 3,05mm dia.
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on 25,4mm pin stub
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on 25mm JEOL stub
S128A1 Shadowed latex particles 0,120 um dia. on 3,05mm grid
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on 25mm Hitachi stub
KPFM and EFM test sample with Al and Au line arrays, mounted on 15mm metal AFM disc
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